Download file to see previous pages...
The material to be scanned is placed below the tip, as the tip moves across the surface it is attracted or repelled by different forces, the atomic deflection from rest is recorded and an imaging software is used to process the results. The results normally appears as a topographical image of the surface imaged2.
Different imaging techniques are used to picture the surface or for different surface analysis, they include the contact mode, non-contact mode and tapping mode. With assistance from specialized software, Atomic Force Microscope can be used to measure characteristics of material surface that other types of microscope cannot image.
This method is whereby the tip gets into contact with the surface being scanned, it is the most common mode used in atomic force scanning. The tip have a repulsive force coefficient of 9N. As the tip moves over the surface, the deflection of the cantilever generated is fed to a DC amplifier system, which verifies it and tries to much it with the desired. If the magnitude of deflections is different from the required one, the feedback amplifier system increases the voltage supply to the piezoelectric positioning system to raise or lower the material surface relative to the tip until the desired voltage is achieved3. The measure of voltage supplied to the piezoelectric positioning system gives the degree of roughness and surface features of the material. This is displayed laterally to the position of the sample.
The main problem with the contact mode is the application disproportionate force to the sample by the probe leading destruction of the sample surface; this can be minimized by reducing the amount of force applied by the probe. However, there are limits to the minimum force that the operator can apply during scanning in ambient conditions.
Ambient conditions possess some challenges to AFS since a thin layer of about 30 monolayers made up of
...Download file to see next pagesRead More
In the second article, the authors Mike, Harton and Guillaume, are more concern with analyzing the atomic force microscope in ascertaining magnitude and the nature of strains upon which cells often respond. The third article was authored by Kenneth A, and the article aims at ascertaining the role of the Subcellular Stress-Shear distribution in the Endothelial Cell mechanotransduction.
Fluorescence emission in the fluorescence microscopy is not only characterized by the position and intensity but also the wavelength, lifetime and polarization. Use of fluorescence imaging has made it easier the observation of photo physical events. Rotation and mobility of the fluorescence is measured through the TR-FAIM as “Time-resolved fluorescence anisotropy imaging”.
The detection of the antibody reaction with the specific antigens is examined and all the physiological process behind it. The experimentation processes of immune-imaging of the cells on the photon of the fluorescent microscopy are also explored in the paper.
This force is called radial force or centripetal force, since it acts along the orbit’s radius. According to Newton’s Second Law of motion, this force makes the object to accelerate.
Before the experiment is conducted,
Magnetic force acting on a current can be established by adding the magnetic force acting on each charge that contributes to the current. When an electric wire is exposed to a magnet, the current being carried in the wire will be affected by a magnetic field. The consequence often comes in form a force.
4 Pages(1000 words)Lab Report
GOT A TRICKY QUESTION? RECEIVE AN ANSWER FROM STUDENTS LIKE YOU!
Let us find you another Lab Report on topic Atomic force microscopy for FREE!