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Procurement of a Suitable Scanning Electron Microscope - Assignment Example

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"Procurement of a Suitable Scanning Electron Microscope" paper presents an introduction to electron – matter interaction for a better understanding of electron microscopy and SEM. It was suggested that the price discovery can be either through negotiations prior to or post invitation of open tender…
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Procurement of a Suitable Scanning Electron Microscope
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Download file to see previous pages While resolution in case of an optical microscope is limited to about 100 mm (a typical best possible value); electron microscopy stretched it down to sub-micrometers (most common SEM resolution) to even sub-nanometer level (a typical Transmission Electron Microscope (TEM) resolution). Not just that, electron microscopy was further augmented with suitable detectors to even extract quantitative micro-chemistry and micro-crystallographic information not only from the surfaces (in case of SEM) but also from within the bulk of the material in case of TEM. Enhancement in resolution could be possible because of a much smaller value of the wavelength of the accelerated electrons (which are the probe in electron microscopy) as compared to that of the visible light (which is the probe in case of optical microscopy). Why electron microscopy could be expanded to provide much more information is because the interaction of electrons with matter leads to the generation of a variety of signals like different kinds of electrons and X-rays and these signals contain valuable information about not only the topography of the surface but also about the chemistry of the material and orientation of the grains. Therefore, it becomes relevant to present a brief introduction to electron – matter interaction for a better understanding of electron microscopy in general and SEM in particular.

When an electron beam strikes with matters it interacts with the electrons – outer shell as well as core electrons and nucleus of the matter. Depending on the energy and intensity of the incident electron beam and thickness of the material being exposed to the electron beam different kinds of signals are generated. A schematic diagram showing a typical electron – matter interaction is presented in Figure 1.

The electron beam can penetrate through the specimen only if its thickness is less than 100 nm and only then the transmitted signals are produced. Transmitted signals are used in Transmission Electron Microscope (TEM) and related analytical equipment like STEM (Scanning TEM), ATEM (Analytical TEM), HRTEM (High-Resolution TEM), etc with attachments like EELS, HAADF, etc. ...Download file to see next pagesRead More
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